Diagnose integrator-, gain-, and slice-thickness-dependent abnormalities
When a DAS-side image fault has been narrowed down but not yet explained, three source-stated dependency patterns tell you exactly where in the acquisition chain to keep looking: which views are bad points at one of two integrators, which GAIN numbers are bad — and whether it's odd/even-only or every view — points at a specific gain circuit, and which image row is bad points at a specific detector element by way of the slice-thickness element selection table (source 2D201-065, §5.4.4-5.4.6, p.84-85).
Full step-by-step for Diagnose integrator-, gain-, and slice-thickness-dependent abnormalities
All 4 steps are documented in the FSELIB Aquilion 16 (TSX-101A) service manual — re-authored, web-first, with the real figures from the source.
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Source: 2D201-065E*D p.84-85. Preview re-authored by FSELIB — the full procedure with figures and steps is in the paid service manual.