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DAS/detector troubleshooting — slice thickness-dependent (row-dependent) abnormality

The detector and the DAS change the slice thickness by switching which detector elements (segments) feed each output row. Because of that switching, the same physical defective segment can show up as an abnormality in a different image row depending on which slice thickness — and which rows-used mode (16 rows / 4 rows / single row) — is active at scan time. This page reproduces the manual's own Sl

Applies to
Activion16 (TSX-031A). Applies identically to both DAS hardware generations documented in this manual: CDAS-035A/1A (this text at §2.8.6, p.188) and CDAS-035A/2A (the literal duplicate at §2.16.6, p.282, folded into this atom). Source states no other model- or revision-specific restriction for this section.
Steps
7 steps
Source
2D201-113EN*J §2.8.6 'Slice thickness-dependent abnormality' (p.188, CDAS-035A/1A generation), literal duplicate at §2.16.6 (p.282, CDAS-035A/2A generation) — identical text and table

Tools & parts

ItemPart numberQty
Main detector array (axial segments, Seg. 1-28)n/a in source
Slice-thickness switchesn/a in source

Full step-by-step for DAS/detector troubleshooting — slice thickness-dependent (row-dependent) abnormality

All 7 steps are documented in the FSELIB Activion16 (TSX-031A) service manual — re-authored, web-first, with the real figures from the source.

Open the full procedure

Related DAS guides

View all Activion16 (TSX-031A) guides

Source: 2D201-113EN*J §2.8.6 'Slice thickness-dependent abnormality' (p.188, CDAS-035A/1A generation), literal duplicate at §2.16.6 (p.282, CDAS-035A/2A generation) — identical text and table. Preview re-authored by FSELIB — the full procedure with figures and steps is in the paid service manual.