DAS/detector troubleshooting — slice thickness-dependent (row-dependent) abnormality
The detector and the DAS change the slice thickness by switching which detector elements (segments) feed each output row. Because of that switching, the same physical defective segment can show up as an abnormality in a different image row depending on which slice thickness — and which rows-used mode (16 rows / 4 rows / single row) — is active at scan time. This page reproduces the manual's own Sl
Tools & parts
| Item | Part number | Qty |
|---|---|---|
| Main detector array (axial segments, Seg. 1-28) | n/a in source | |
| Slice-thickness switches | n/a in source |
Full step-by-step for DAS/detector troubleshooting — slice thickness-dependent (row-dependent) abnormality
All 7 steps are documented in the FSELIB Activion16 (TSX-031A) service manual — re-authored, web-first, with the real figures from the source.
Open the full procedureRelated DAS guides
Source: 2D201-113EN*J §2.8.6 'Slice thickness-dependent abnormality' (p.188, CDAS-035A/1A generation), literal duplicate at §2.16.6 (p.282, CDAS-035A/2A generation) — identical text and table. Preview re-authored by FSELIB — the full procedure with figures and steps is in the paid service manual.