ProcedureDASFunctional ChecksCheck

Run the DAS DCA test procedures (X-ray output, offset data, test pattern checks)

Use the console's DCA program to run the three DCA-driven checks most often used to correct a data-acquisition-section problem: an X-ray output check, an offset data check, and a test pattern check. This page does not teach you how to drive DCA itself — source explicitly defers that to "the service manual for the system software" — it documents the specific operating sequences, screens, and result

Applies to
Activion16 (TSX-031A), Data Acquisition Section (DAS), CDAS-035A/1A generation (Converter-16 / Control-16 PWBs, source §2.2-2.9). This atom covers §2.8.8 only. Source also prints a parallel §2.16.8 'DCA test procedures' for the CDAS-035A/2A \"AJ\" generation (AJ-CONVERTER / AJ-CONTROL PWBs) — unlike other paired 1A/AJ sections in this manual, §2.16.8 is NOT a verbatim duplicate of §2.8.8: its \"Channel arrangement for DCA display\" table differs at channels 19/20 (§2.8.8 here: 19ch/E19 = \"* DAS STATUS\", 20ch/E20 = \"Spare (ffff)\"; §2.16.8: 19ch/E19 = \"Integrator information (Integ) (aaaa or bbbb)\", 20ch/E20 = \"DAS Status (*)\"). §2.16.8 is marked 'nav' in the coverage ledger and is not folded into this atom; flagged here for whoever atomizes it.
Steps
19 steps
Source
2D201-113EN*J §2.8.8 'DCA test procedures' (pp.190-202)

Full step-by-step for Run the DAS DCA test procedures (X-ray output, offset data, test pattern checks)

All 19 steps are documented in the FSELIB Activion16 (TSX-031A) service manual — re-authored, web-first, with the real figures from the source.

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Related DAS guides

Check the DAS supply voltage (AJ-CONTROL / AJ-CONVERTER PWBs)3 stepsCheck the DAS supply voltage (Control-16 / Converter-16 PWBs)3 stepsDAS gain-dependent abnormality — reading the GAIN/odd-even-view pattern (§2.8.5)4 stepsDAS integrator-dependent abnormality — odd/even-view fault pattern (Integ-A / Integ-B)0 stepsDAS/detector troubleshooting — slice thickness-dependent (row-dependent) abnormality7 stepsData acquisition faults — cause × symptom matrix and 4 isolation flowcharts (DAS)8 steps
View all Activion16 (TSX-031A) guides

Related error codes

B1100000Error in GTSB11A0000The CT fluoroscopy circuit is abnormalB1270000Error in Table movementB1300000Error in Wedge movementB1320000Error in Slit movementB1330000Error in BeamTrimmer movement

Source: 2D201-113EN*J §2.8.8 'DCA test procedures' (pp.190-202). Preview re-authored by FSELIB — the full procedure with figures and steps is in the paid service manual.